Society for Applied Microwave Electronics Engineering & Research
Ministry of Electronics & Information Technology
Government of India
The EMI/EMC division has expertise in the field of EMC testing for commercial electronic products as well as electronics required for defense and space applications (MIL STD products). It provides Test, Measurement and Design Consultancy services to customers for their satisfaction in achieving Electromagnetic Compatibility in electronic products to comply with National/International EMC Standards. It has ISO/IEC 17025:2005 and ISO 9001:2008. The NABL accredited EMI/EMC Test facility is located at CBD Belapur, Navi Mumbai. EMC testing is done as per various civilian and military standards like CISPR 11, CISPR 22, CISPR 24, IEC 61000-4, MIL-STD-461C/D/E. Design Consultancy and solutions are also offered to customers for making their products compliant with various EMC standards. The test and consultancy service is routinely made available to customers desirous of obtaining CE marking and exporting their products. Details for the EMC services are available in the Services Offered section of the site.
The division undertakes both research and test, design consultancy activities. in the area of Electromagnetic Interference and Compatibility The division also has the necessary experience and expertise for undertaking projects for high pulsed power applications viz. High Power Pulsed Radar Transmitters.
- High Power Radar Transmitter Activities
The Division has developed the following Low Noise High Pulsed Power Microwave Transmitters for Radar Applications.
1. Ku band TWT based 10 KW Low Noise transmitter
2. One MW Klystron based S band Transmitter for Doppler Weather Radar.
3. A TWT Test bench for C band coupled cavity TWT
4. Hard Tube Modulator based C band and S Band Pulse Coded Transmitters for Tracking radar Applications.
EMC Research activities
- Susceptibility of HPEM and UW to Electronic circuits
The division has taken up core activities in the area of development of High power electromagnetic (HPEM) sources and a Electromagnetic Pulse (EMP) generator which can be used as a NEMP simulator for testing equipment under MIL STD 461E. HPEM sources and RS 105 test equipment are available in the international market but in India we do not have manufacturers of the facility. RS105 is a high peak voltage transient immunity test specifically intended to simulate the EMP pulse Only Defense labs in India have custom made NEMP simulators for their use. To equip the EMC test lab anticipating the requirements for HPEM sources and NEMP simulators we are developing the RS 105 set up which generates a 50KV/m transient field simulating UWB interference. We have developed the high voltage transient generator and tested it on dummy load. We have also developed the parallel plate waveguide based TEM cell and tested it at low powers. The integrated testing of the set up with necessary controls is in progress. The developed unit will then be calibrated and susceptibility of various IT and telecom products will be evaluated.
- Use Of Substrate Integrated Waveguide ( SIW ) technology component development
Substrate Integrated Waveguide ( SIW ) technology is the technology of the future as many high frequency and mm wave system and antenna applications would require us to use planar techniques to optimize in cost and ease of fabrication (adapting PCB techniques) So under this project the goal is to design and develop SIW horn antennas which will give broad bandwidth in the frequency range covering 18 - 26 Ghz for testing Shielding Effectiveness (S.E.) We give services for testing Shielding Effectiveness (S.E.)upto 18 Ghz and so we would like to develop the antennas in house for testing upto 26 GHz which is a requirement we anticipate by many vendors who want MIL STD testing.Also to solve Signal integrity and other EMC issues we use near field probes upto 1 Ghz . But with miniaturization and high speed digital circuits going up to 5 GHz and their harmonics going above 20 Ghz we would need to use near field hand held high frequency probes wherein these planar SIW horn antennas can be used.